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IRIS-GAN: Staged Specialist Detection of Deepfake Faces

2026-06-03 · arXiv: 2606.04863

One-line summary

An AI research paper on IRIS-GAN: Staged Specialist Detection of Deepfake Faces.

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Chinese explanation / 中文解读

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Original abstract

We introduce IRIS-GAN, a specialist forensic detector for synthetic face images under cross-generator shift. Rather than addressing universal synthetic-image detection, we focus on faces generated by generative adversarial networks (GANs), which are state-of-the-art in deepfake content, and train the detector through staged exposure to increasingly demanding GAN families while retaining earlier generators. The final model reaches fake-detection rates above 99% across the GAN families considered and classifies an external real-face dataset with 98.9% accuracy. Grad-CAM analysis further reveals measurable generator-dependent spatial response patterns, which remain informative for a secondary heatmap-only classifier. Out-of-family tests on diffusion-generated faces confirm that IRIS-GAN is a specialist detector, with some capability to reach non-GAN deepfakes. These results establish staged training as an effective strategy for robust GAN-face forensics.

5.0Engineering value
7.0Research novelty
4.0Business relevance

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