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Circuit Claims Depend on What Is Extracted and How It Is Compared
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An AI research paper on Circuit Claims Depend on What Is Extracted and How It Is Compared.
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Chinese explanation / 中文解读
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Original abstract
Circuit extraction identifies a small set of model components whose presence preserves a target behavior under ablation, and the resulting circuit is often read as the mechanism behind that behavior. We argue that this reading is under-determined: preserving behavior does not single out one circuit, because the claim it supports depends on which circuit is reported and how two circuits are compared. We make this concrete in a synthetic Lean tactic-prediction benchmark -- predicting the next step of a proof -- where fixed proof rules with randomized surface form let differences between extracted circuits be attributed to these choices rather than to the task. Across dense and weight-sparse checkpoints (most weights constrained to zero) of the same transformer, evaluated on atomic (single-rule) and compositional (multi-rule) proofs, we vary which extracted object is reported (a compact prediction-preserving circuit, a broader graph that also keeps surrounding read, write, and routing structure, or the smallest subgraph meeting a post-ablation loss threshold), and whether each attention head's query and key are represented jointly or separately. Exact component-to-component edge overlap is low and sensitive to these choices, at times dropping to a random baseline, while two coarser summaries stay stable: the set of selected attention heads, and the circuit-size ranking of conditions that differ in which supervised checkpoint initializes reinforcement learning (RL). The largest accuracy gains from RL on compositional proofs come with the most structure beyond the atomic circuits. A circuit-level claim is therefore well defined only once one states which circuit is reported, the pruning threshold used to extract it, and the level at which circuits are compared. We distill these requirements into a reporting practice for circuit-extraction studies.
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